Saman Adham, Jonathan Chang, Hung-Jen Liao, John Hung, Ting-Hua Hsieh. The importance of DFX, a foundry perspective. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-6, IEEE, 2014. [doi]
Abstract is missing.