Wilfried Yves Hamilton Adoni, Moez Krichen, Tarik Nahhal, Abdeltif Elbyed. Multi-path Coverage of All Final States for Model-Based Testing Theory Using Spark In-memory Design. In Belgacem Ben Hedia, Yu-Fang Chen, GaiYun Liu, Zhenhua Yu, editors, Verification and Evaluation of Computer and Communication Systems - 14th International Conference, VECoS 2020, Xi'an, China, October 26-27, 2020, Proceedings. Volume 12519 of Lecture Notes in Computer Science, pages 195-204, Springer, 2020. [doi]
Abstract is missing.