Surath Aebtarm, Nizar Bouguila. An optimal bivariate Poisson field chart for monitoring defects. In Proceedings of the 22nd Canadian Conference on Electrical and Computer Engineering, CCECE 2009, 3-6 May 2009, Delta St. John s Hotel and Conference Centre, St. John s, Newfoundland, Canada. pages 691-694, IEEE, 2009. [doi]
Abstract is missing.