Engin Afacan, Günhan Dündar, I. Faik Baskaya. Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena. Microelectronics Reliability, 54(2):397-403, 2014. [doi]
@article{AfacanDB14,
title = {Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena},
author = {Engin Afacan and Günhan Dündar and I. Faik Baskaya},
year = {2014},
doi = {10.1016/j.microrel.2013.08.013},
url = {http://dx.doi.org/10.1016/j.microrel.2013.08.013},
researchr = {https://researchr.org/publication/AfacanDB14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {2},
pages = {397-403},
}