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Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena

Engin Afacan, Günhan Dündar, I. Faik Baskaya. Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena. Microelectronics Reliability, 54(2):397-403, 2014. [doi]

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