Semi-empirical aging model development via accelerated aging test

Engin Afacan, Günhan Dündar, Ali Emre Pusane, I. Faik Baskaya. Semi-empirical aging model development via accelerated aging test. In 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2016, Lisbon, Portugal, June 27-30, 2016. pages 1-4, IEEE, 2016. [doi]

Abstract

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