Statistical interconnect metrics for physical-design optimization

Kanak Agarwal, Mridul Agarwal, Dennis Sylvester, David Blaauw. Statistical interconnect metrics for physical-design optimization. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(7):1273-1288, 2006. [doi]

@article{AgarwalASB06,
  title = {Statistical interconnect metrics for physical-design optimization},
  author = {Kanak Agarwal and Mridul Agarwal and Dennis Sylvester and David Blaauw},
  year = {2006},
  doi = {10.1109/TCAD.2005.855954},
  url = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2005.855954},
  tags = {optimization, design},
  researchr = {https://researchr.org/publication/AgarwalASB06},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {25},
  number = {7},
  pages = {1273-1288},
}