Saurabh Agarwal, Satish Chand. Image forgery detection using Markov features in undecimated wavelet transform. In Sanjay Goel, Dheeraj Sanghi, Albert Y. Zomaya, Azzedine Boukerche, Ratan K. Ghosh, Manoj Singh Gaur, Rahul Banerjee, Vikas Saxena, editors, Ninth International Conference on Contemporary Computing, IC3 2016, Noida, India, August 11-13, 2016. pages 1-6, IEEE, 2016. [doi]
Abstract is missing.