Amit Agarwal, Bipul Chandra Paul, Kaushik Roy. A Novel Fault Tolerant Cache to Improve Yield in Nanometer Technologies. In 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 12-14 July 2004, Funchal, Madeira Island, Portugal. pages 149-154, IEEE Computer Society, 2004. [doi]
Abstract is missing.