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Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene. Impact and mitigation of SRAM read path aging. Microelectronics Reliability, 87:158-167, 2018. [doi]
Abstract is missing.