Electron delay analysis and image charge effect in AlGaN/GaN HEMT on silicon substrate - researchr publication authors

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A. Agboton, N. Defrance, P. Altuntas, V. Avramovic, A. Cutivet, R. Ouhachi, J.-C. De Jaeger, S. Bouzid-Driad, H. Maher, M. Renvoise, P. Frijlink. Electron delay analysis and image charge effect in AlGaN/GaN HEMT on silicon substrate. In Proceedings of the European Solid-State Device Research Conference, ESSDERC 2013, Bucharest, Romania, September 16-20, 2013. pages 57-60, IEEE, 2013. [doi]

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