Probability calculation of read failures in nano-scaled SRAM cells under process variations

Hossein Aghababa, Behzad Ebrahimi, Ali Afzali-Kusha, Massoud Pedram. Probability calculation of read failures in nano-scaled SRAM cells under process variations. Microelectronics Reliability, 52(11):2805-2811, 2012. [doi]

Abstract

Abstract is missing.