Hossein Aghababa, Alireza Khosropour, Ali Afzali-Kusha, Behjat Forouzandeh, Massoud Pedram. Statistical estimation of leakage power dissipation in nano-scale complementary metal oxide semiconductor digital circuits using generalised extreme value distribution. IET Circuits, Devices & Systems, 6(5):273-278, 2012. [doi]
Abstract is missing.