Temperature-Gradient-Based Burn-In and Test Scheduling for 3-D Stacked ICs

Nima Aghaee, Zebo Peng, Petru Eles. Temperature-Gradient-Based Burn-In and Test Scheduling for 3-D Stacked ICs. IEEE Trans. VLSI Syst., 23(12):2992-3005, 2015. [doi]

Authors

Nima Aghaee

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Zebo Peng

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Petru Eles

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