Pattern matcher for OCR-corrupted documents and its evaluation

Stefan Agne, Hans-Günther Hein. Pattern matcher for OCR-corrupted documents and its evaluation. In Daniel P. Lopresti, Jiangying Zhou, editors, Document Recognition V, San Jose, CA, USA, January 24, 1998. Volume 3305 of SPIE Proceedings, pages 160-168, SPIE, 1998. [doi]

@inproceedings{AgneH98,
  title = {Pattern matcher for OCR-corrupted documents and its evaluation},
  author = {Stefan Agne and Hans-Günther Hein},
  year = {1998},
  doi = {10.1117/12.304629},
  url = {http://dx.doi.org/10.1117/12.304629},
  researchr = {https://researchr.org/publication/AgneH98},
  cites = {0},
  citedby = {0},
  pages = {160-168},
  booktitle = {Document Recognition V, San Jose, CA, USA, January 24, 1998},
  editor = {Daniel P. Lopresti and Jiangying Zhou},
  volume = {3305},
  series = {SPIE Proceedings},
  publisher = {SPIE},
  isbn = {978-0-8194-2745-8},
}