PMOS NBTI-induced circuit mismatch in advanced technologies

M. Agostinelli, S. Lau, S. Pae, P. Marzolf, H. Muthali, S. Jacobs. PMOS NBTI-induced circuit mismatch in advanced technologies. Microelectronics Reliability, 46(1):63-68, 2006. [doi]

Abstract

Abstract is missing.