Vishwani D. Agrawal. Editorial. J. Electronic Testing, 32(3):241-242, 2016. [doi]
@article{Agrawal16b,
title = {Editorial},
author = {Vishwani D. Agrawal},
year = {2016},
doi = {10.1007/s10836-016-5596-y},
url = {http://dx.doi.org/10.1007/s10836-016-5596-y},
researchr = {https://researchr.org/publication/Agrawal16b},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {32},
number = {3},
pages = {241-242},
}