Vishwani D. Agrawal. Editorial. J. Electronic Testing, 33(2):141, 2017. [doi]
@article{Agrawal17a, title = {Editorial}, author = {Vishwani D. Agrawal}, year = {2017}, doi = {10.1007/s10836-017-5654-0}, url = {http://dx.doi.org/10.1007/s10836-017-5654-0}, researchr = {https://researchr.org/publication/Agrawal17a}, cites = {0}, citedby = {0}, journal = {J. Electronic Testing}, volume = {33}, number = {2}, pages = {141}, }