Vishwani D. Agrawal. Editorial. J. Electronic Testing, 34(3):209, 2018. [doi]
@article{Agrawal18b,
title = {Editorial},
author = {Vishwani D. Agrawal},
year = {2018},
doi = {10.1007/s10836-018-5735-8},
url = {https://doi.org/10.1007/s10836-018-5735-8},
researchr = {https://researchr.org/publication/Agrawal18b},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {34},
number = {3},
pages = {209},
}