Vishwani D. Agrawal. Editorial. J. Electronic Testing, 35(4):421-422, 2019. [doi]
@article{Agrawal19c,
title = {Editorial},
author = {Vishwani D. Agrawal},
year = {2019},
doi = {10.1007/s10836-019-05820-0},
url = {https://doi.org/10.1007/s10836-019-05820-0},
researchr = {https://researchr.org/publication/Agrawal19c},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {35},
number = {4},
pages = {421-422},
}