Vishwani D. Agrawal, Robert C. Aitken, J. Braden, Joan Figueras, S. Kumar, Hans-Joachim Wunderlich, Yervant Zorian. Power Dissipation During Testing: Should We Worry About it?. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 456-457, IEEE Computer Society, 1997. [doi]
Abstract is missing.