Mukesh Agrawal, Krishnendu Chakrabarty, Bill Eklow. A Distributed, Reconfigurable, and Reusable BIST Infrastructure for Test and Diagnosis of 3-D-Stacked ICs. IEEE Trans. on CAD of Integrated Circuits and Systems, 35(2):309-322, 2016. [doi]
@article{AgrawalCE16,
title = {A Distributed, Reconfigurable, and Reusable BIST Infrastructure for Test and Diagnosis of 3-D-Stacked ICs},
author = {Mukesh Agrawal and Krishnendu Chakrabarty and Bill Eklow},
year = {2016},
doi = {10.1109/TCAD.2015.2459044},
url = {http://dx.doi.org/10.1109/TCAD.2015.2459044},
researchr = {https://researchr.org/publication/AgrawalCE16},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {35},
number = {2},
pages = {309-322},
}