A deep learning method for pinwheel artifact reduction in CT

Utkarsh Agrawal, Rajesh Langoju, Yasuhiro Imai, Risa Shigemasa, Bipul Das. A deep learning method for pinwheel artifact reduction in CT. In Olivier Colliot, Ivana Isgum, editors, Medical Imaging 2023: Image Processing, San Diego, CA, USA, February 19-23, 2023. Volume 12464 of SPIE Proceedings, SPIE, 2023. [doi]

Abstract

Abstract is missing.