Model-Based 2.5-D Deconvolution for Extended Depth of Field in Brightfield Microscopy

Francois Aguet, Dimitri Van De Ville, Michael Unser. Model-Based 2.5-D Deconvolution for Extended Depth of Field in Brightfield Microscopy. IEEE Transactions on Image Processing, 17(7):1144-1153, 2008. [doi]

Abstract

Abstract is missing.