Radiation sensitivity of XOR topologies in multigate technologies under voltage variability - researchr publication authors

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Ygor Q. de Aguiar, Cristina Meinhardt, Ricardo A. L. Reis. Radiation sensitivity of XOR topologies in multigate technologies under voltage variability. In 8th IEEE Latin American Symposium on Circuits & Systems, LASCAS 2017, Bariloche, Argentina, February 20-23, 2017. pages 1-4, IEEE, 2017. [doi]

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