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MC/DC Test Cases Generation Based on BDDs

Faustin Ahishakiye, José-Ignacio Requeno Jarabo, Lars Michael Kristensen, Volker Stolz. MC/DC Test Cases Generation Based on BDDs. In Shengchao Qin, Jim Woodcock, Wenhui Zhang, editors, Dependable Software Engineering. Theories, Tools, and Applications - 7th International Symposium, SETTA 2021, Beijing, China, November 25-27, 2021, Proceedings. Volume 13071 of Lecture Notes in Computer Science, pages 178-197, Springer, 2021. [doi]

Authors

Faustin Ahishakiye

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José-Ignacio Requeno Jarabo

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Lars Michael Kristensen

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Volker Stolz

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