MC/DC Test Cases Generation Based on BDDs

Faustin Ahishakiye, José-Ignacio Requeno Jarabo, Lars Michael Kristensen, Volker Stolz. MC/DC Test Cases Generation Based on BDDs. In Shengchao Qin, Jim Woodcock, Wenhui Zhang, editors, Dependable Software Engineering. Theories, Tools, and Applications - 7th International Symposium, SETTA 2021, Beijing, China, November 25-27, 2021, Proceedings. Volume 13071 of Lecture Notes in Computer Science, pages 178-197, Springer, 2021. [doi]

@inproceedings{AhishakiyeJKS21,
  title = {MC/DC Test Cases Generation Based on BDDs},
  author = {Faustin Ahishakiye and José-Ignacio Requeno Jarabo and Lars Michael Kristensen and Volker Stolz},
  year = {2021},
  doi = {10.1007/978-3-030-91265-9_10},
  url = {https://doi.org/10.1007/978-3-030-91265-9_10},
  researchr = {https://researchr.org/publication/AhishakiyeJKS21},
  cites = {0},
  citedby = {0},
  pages = {178-197},
  booktitle = {Dependable Software Engineering. Theories, Tools, and Applications - 7th International Symposium, SETTA 2021, Beijing, China, November 25-27, 2021, Proceedings},
  editor = {Shengchao Qin and Jim Woodcock and Wenhui Zhang},
  volume = {13071},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {978-3-030-91265-9},
}