Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris. Harnessing process variations for optimizing wafer-level probe-test flow. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-8, IEEE, 2016. [doi]
Abstract is missing.