A new image transform for a more crop-resilient NPT

Ayman M. T. Ahmed, Dwight D. Day. A new image transform for a more crop-resilient NPT. In 2009 IEEE International Conference on Electro/Information Technology, EIT 2009, Windsor, Ontario, Canada, June 7-9, 2009. pages 378-382, IEEE, 2009. [doi]

Abstract

Abstract is missing.