Nisar Ahmed, Mohammad Tehranipoor. Improving Transition Delay Fault Coverage Using Hybrid Scan-Based Technique. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 187-198, IEEE Computer Society, 2005. [doi]
Abstract is missing.