Compact Functional Test Generation for Memristive Deep Learning Implementations using Approximate Gradient Ranking

Soyed Tuhin Ahmed, Mehdi B. Tahoori. Compact Functional Test Generation for Memristive Deep Learning Implementations using Approximate Gradient Ranking. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 239-248, IEEE, 2022. [doi]

Authors

Soyed Tuhin Ahmed

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Mehdi B. Tahoori

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