Ibrahim Ahmed, Shuze Zhao, James Meijers, Olivier Trescases, Vaughn Betz. Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs. In 28th International Conference on Field Programmable Logic and Applications, FPL 2018, Dublin, Ireland, August 27-31, 2018. pages 68-75, IEEE, 2018. [doi]
@inproceedings{AhmedZMTB18,
title = {Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs},
author = {Ibrahim Ahmed and Shuze Zhao and James Meijers and Olivier Trescases and Vaughn Betz},
year = {2018},
doi = {10.1109/FPL.2018.00020},
url = {https://doi.org/10.1109/FPL.2018.00020},
researchr = {https://researchr.org/publication/AhmedZMTB18},
cites = {0},
citedby = {0},
pages = {68-75},
booktitle = {28th International Conference on Field Programmable Logic and Applications, FPL 2018, Dublin, Ireland, August 27-31, 2018},
publisher = {IEEE},
isbn = {978-1-5386-8517-4},
}