Deep Learning-Based Distortion Sensitivity Prediction for Full-Reference Image Quality Assessment - researchr publication

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Sewoong Ahn, Yeji Choi, Kwangjin Yoon. Deep Learning-Based Distortion Sensitivity Prediction for Full-Reference Image Quality Assessment. In IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2021, virtual, June 19-25, 2021. pages 344-353, Computer Vision Foundation / IEEE, 2021. [doi]

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