Chanho Ahn, Kikyung Kim, Ji Won Baek, Jongin Lim 0002, Seungju Han. Sample-wise Label Confidence Incorporation for Learning with Noisy Labels. In IEEE/CVF International Conference on Computer Vision, ICCV 2023, Paris, France, October 1-6, 2023. pages 1823-1832, IEEE, 2023. [doi]
Abstract is missing.