A Floorprint-Based Defect Tolerance for Nano-Scale Application-Specific IC

Sanghyun Ahn, Zachary D. Patitz, Noh-Jin Park, Hyoung Joong Kim, Nohpill Park. A Floorprint-Based Defect Tolerance for Nano-Scale Application-Specific IC. IEEE T. Instrumentation and Measurement, 58(5):1283-1290, 2009. [doi]

Abstract

Abstract is missing.