Peter Ahn, Ji-Yong Um, EunJung Choi, Hyunmook Park, Jaseung Gou, Kwangjun Cho, Kangbong Seo, Sangdong Yoo. Power noise rejection and device noise analysis at the reference level of ramp ADC. In Ralf Widenhorn, Antoine Dupret, editors, Image Sensors and Imaging Systems 2015, San Francisco, California, United States, 8-12 February 2015. Volume 9403 of SPIE Proceedings, SPIE, 2015. [doi]
Abstract is missing.