D. P. Ahrens, P. J. Bednarczyk, D. L. Denburg, R. M. Robertson. TPG2 : An Automatic Test Program Generator for Custom ICs. In Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. pages 762-767, IEEE Computer Society, 1984.
@inproceedings{AhrensBDR84,
title = {TPG2 : An Automatic Test Program Generator for Custom ICs},
author = {D. P. Ahrens and P. J. Bednarczyk and D. L. Denburg and R. M. Robertson},
year = {1984},
tags = {testing},
researchr = {https://researchr.org/publication/AhrensBDR84},
cites = {0},
citedby = {0},
pages = {762-767},
booktitle = {Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984},
publisher = {IEEE Computer Society},
}