An Image-Based Approach to Extreme Scale in Situ Visualization and Analysis

James J. Ahrens, Sébastien Jourdain, Patrick O'Leary, John Patchett, David H. Rogers, Mark Petersen. An Image-Based Approach to Extreme Scale in Situ Visualization and Analysis. In International Conference for High Performance Computing, Networking, Storage and Analysis, SC 2014, New Orleans, LA, USA, November 16-21, 2014. pages 424-434, IEEE, 2014. [doi]

Abstract

Abstract is missing.