Coupling Noise Analysis for VLIS and ULSI Circuits

Kathirgamar Aingaran, Fabian Klass, Chin-Man Kim, Chaim Amir, Joydeep Mitra, Eileen You, Jamil Mohd, Sai-keung Dong. Coupling Noise Analysis for VLIS and ULSI Circuits. In 1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA. pages 485-490, IEEE Computer Society, 2000. [doi]

Authors

Kathirgamar Aingaran

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Fabian Klass

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Chin-Man Kim

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Chaim Amir

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Joydeep Mitra

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Eileen You

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Jamil Mohd

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Sai-keung Dong

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