Kathirgamar Aingaran, Fabian Klass, Chin-Man Kim, Chaim Amir, Joydeep Mitra, Eileen You, Jamil Mohd, Sai-keung Dong. Coupling Noise Analysis for VLIS and ULSI Circuits. In 1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA. pages 485-490, IEEE Computer Society, 2000. [doi]
@inproceedings{AingaranKKAMYMD00,
title = {Coupling Noise Analysis for VLIS and ULSI Circuits},
author = {Kathirgamar Aingaran and Fabian Klass and Chin-Man Kim and Chaim Amir and Joydeep Mitra and Eileen You and Jamil Mohd and Sai-keung Dong},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/isqed/2000/0525/00/05250485abs.htm},
tags = {analysis},
researchr = {https://researchr.org/publication/AingaranKKAMYMD00},
cites = {0},
citedby = {0},
pages = {485-490},
booktitle = {1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-0525-2},
}