Robert C. Aitken. On-chip versus off-chip test: an artificial dichotomy. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 1146, IEEE Computer Society, 1998. [doi]
@inproceedings{Aitken98,
title = {On-chip versus off-chip test: an artificial dichotomy},
author = {Robert C. Aitken},
year = {1998},
url = {http://www.computer.org/proceedings/itc/5093/50931146.pdf},
tags = {testing, C++},
researchr = {https://researchr.org/publication/Aitken98},
cites = {0},
citedby = {0},
pages = {1146},
booktitle = {Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998},
publisher = {IEEE Computer Society},
isbn = {0-7803-5093-6},
}