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Aliasing probability of non-exhaustive randomized syndrome tests

Robert C. Aitken, Vinod K. Agarwal. Aliasing probability of non-exhaustive randomized syndrome tests. In 1988 IEEE International Conference on Computer-Aided Design, ICCAD 1988, Santa Clara, CA, USA, November 7-10, 1988. Digest of Technical Papers. pages 232-235, IEEE, 1988. [doi]

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Robert C. Aitken

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Vinod K. Agarwal

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