Robert C. Aitken, Vinod K. Agarwal. Aliasing probability of non-exhaustive randomized syndrome tests. In 1988 IEEE International Conference on Computer-Aided Design, ICCAD 1988, Santa Clara, CA, USA, November 7-10, 1988. Digest of Technical Papers. pages 232-235, IEEE, 1988. [doi]
@inproceedings{AitkenA88,
title = {Aliasing probability of non-exhaustive randomized syndrome tests},
author = {Robert C. Aitken and Vinod K. Agarwal},
year = {1988},
doi = {10.1109/ICCAD.1988.122500},
url = {http://dx.doi.org/10.1109/ICCAD.1988.122500},
researchr = {https://researchr.org/publication/AitkenA88},
cites = {0},
citedby = {0},
pages = {232-235},
booktitle = {1988 IEEE International Conference on Computer-Aided Design, ICCAD 1988, Santa Clara, CA, USA, November 7-10, 1988. Digest of Technical Papers},
publisher = {IEEE},
isbn = {0-8186-0869-2},
}