Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken. An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 459, IEEE Computer Society, 1997. [doi]
@inproceedings{AitkenBGMN97,
title = {An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing},
author = {Phil Nigh and Wayne M. Needham and Kenneth M. Butler and Peter C. Maxwell and Robert C. Aitken},
year = {1997},
url = {http://csdl.computer.org/comp/proceedings/vts/1997/7810/00/78100459abs.htm},
tags = {testing, C++},
researchr = {https://researchr.org/publication/AitkenBGMN97},
cites = {0},
citedby = {0},
pages = {459},
booktitle = {15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA},
publisher = {IEEE Computer Society},
}