An Image Analysis-Based Automated Method using Deep Learning for Grain Counting

Ramesh Ajikaran, Ashen Iranga Hewarathna, Palanisamy Vigneshwaran, Joseph Charles, Selvarajah Thuseethan. An Image Analysis-Based Automated Method using Deep Learning for Grain Counting. In 17th IEEE International Conference on Industrial and Information Systems, ICIIS 2023, Peradeniya, Sri Lanka, August 25-26, 2023. pages 25-30, IEEE, 2023. [doi]

Abstract

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