Deep Learning Algorithms for the Work Function Fluctuation of Random Nanosized Metal Grains on Gate-All-Around Silicon Nanowire MOSFETs

Chandni Akbar, Yiming Li, Wen-Li Sung. Deep Learning Algorithms for the Work Function Fluctuation of Random Nanosized Metal Grains on Gate-All-Around Silicon Nanowire MOSFETs. IEEE Access, 9:73467-73481, 2021. [doi]

Abstract

Abstract is missing.