Analyzing deep features for trademark retrieval

Cemal Aker, Osman Tursun, Sinan Kalkan. Analyzing deep features for trademark retrieval. In 25th Signal Processing and Communications Applications Conference, SIU 2017, Antalya, Turkey, May 15-18, 2017. pages 1-4, IEEE, 2017. [doi]

Authors

Cemal Aker

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Osman Tursun

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Sinan Kalkan

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