Analyzing deep features for trademark retrieval

Cemal Aker, Osman Tursun, Sinan Kalkan. Analyzing deep features for trademark retrieval. In 25th Signal Processing and Communications Applications Conference, SIU 2017, Antalya, Turkey, May 15-18, 2017. pages 1-4, IEEE, 2017. [doi]

@inproceedings{AkerTK17,
  title = {Analyzing deep features for trademark retrieval},
  author = {Cemal Aker and Osman Tursun and Sinan Kalkan},
  year = {2017},
  doi = {10.1109/SIU.2017.7960426},
  url = {https://doi.org/10.1109/SIU.2017.7960426},
  researchr = {https://researchr.org/publication/AkerTK17},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {25th Signal Processing and Communications Applications Conference, SIU 2017, Antalya, Turkey, May 15-18, 2017},
  publisher = {IEEE},
  isbn = {978-1-5090-6494-6},
}