Akin Akturk, James McGarrity, Neil Goldsman, Daniel J. Lichtenwalner, Brett Hull, Dave Grider, Richard Wilkins. The effects of radiation on the terrestrial operation of SiC MOSFETs. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 2, IEEE, 2018. [doi]
@inproceedings{AkturkMGLHGW18,
title = {The effects of radiation on the terrestrial operation of SiC MOSFETs},
author = {Akin Akturk and James McGarrity and Neil Goldsman and Daniel J. Lichtenwalner and Brett Hull and Dave Grider and Richard Wilkins},
year = {2018},
doi = {10.1109/IRPS.2018.8353543},
url = {https://doi.org/10.1109/IRPS.2018.8353543},
researchr = {https://researchr.org/publication/AkturkMGLHGW18},
cites = {0},
citedby = {0},
pages = {2},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5479-8},
}