Zaid Al-Ars, A. J. van de Goor. Soft Faults and the Importance of Stresses in Memory Testing. In 2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France. pages 1084-1091, IEEE Computer Society, 2004. [doi]
@inproceedings{Al-ArsG04,
title = {Soft Faults and the Importance of Stresses in Memory Testing},
author = {Zaid Al-Ars and A. J. van de Goor},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/date/2004/2085/02/208521084abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/Al-ArsG04},
cites = {0},
citedby = {0},
pages = {1084-1091},
booktitle = {2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-2085-5},
}